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1. Basics of Test and Role of HDLs, 2. Verilog HDL for Design and Test, 3. Fault and Defect Modeling, 4. Fault Simulation Applications and Methods, 5. Test Pattern Generation Methods and Algorithms, 6. Deterministic Test Generation Algorithms, 7. Standard IEEE Test Access Methods, 8. Logic Built-in Self-test, 9. Test Compression, 10. Memory Testing by Means of Memory BIST ISBN-9788132214403
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Pages : 435
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